Roy, S. M. ; Braunstein, Samuel L. (2008) Exponentially enhanced quantum metrology Physical Review Letters, 100 (22). 220501_1-220501_4. ISSN 0031-9007
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Official URL: http://prl.aps.org/abstract/PRL/v100/i22/e220501
Related URL: http://dx.doi.org/10.1103/PhysRevLett.100.220501
Abstract
We show that when a suitable entanglement-generating unitary operator depending on a parameter is applied on N qubits in parallel, a precision of the order of 2−N in estimating the parameter may be achieved. This exponentially improves the precision achievable in classical and in quantum nonentangling strategies.
| Item Type: | Article |
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| Source: | Copyright of this article belongs to The American Physical Society. |
| Keywords: | Quantum Metrology; Quantum Control; Quantum Computation |
| ID Code: | 42885 |
| Deposited On: | 07 Jun 2011 07:06 |
| Last Modified: | 18 May 2016 00:02 |
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