Mangalam, R. V. K. ; Bhat, S. V. ; Iyo, A. ; Tanaka, Y. ; Sundaresan, A. ; Rao, C. N. R. (2008) Dielectric properties, thermal decomposition and related aspects of BiAlO3 Solid State Communications, 146 (11-12). pp. 435-437. ISSN 0038-1098
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Official URL: http://linkinghub.elsevier.com/retrieve/pii/S00381...
Related URL: http://dx.doi.org/10.1016/j.ssc.2008.03.039
Abstract
BiAlO3, prepared under high-pressure and high-temperature conditions has a rhombohedral perovskite structure (R3c with a=5.3747(4) Å and c=13.391(1) Å) and decomposes around 550 °C to form the intermediate Bi2Al4O9 phase along with the Bi26-xAlxO40-y and Al2O3. Above 580 °C, the intermediate phase changes into the Bi26-xAlxO40-y. Dielectric measurements show an anomaly at the decomposition temperature and hysteresis at room temperature with a maximum polarization of ~16 μC/cm2. Raman scattering measurements suggest softening of optical phonon modes, and are consistent with the occurrence of thermal decomposition of the rhombohedral phase to form the thermodynamically stable phase.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| Keywords: | B. High-pressure Synthesis; D. Dielectric Properties; D. Ferroelectricity; E. Raman Scattering |
| ID Code: | 2916 |
| Deposited On: | 09 Oct 2010 07:26 |
| Last Modified: | 30 Sep 2011 06:52 |
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