Dynamic scaling, zero-temperature fixed point, and the random-field Ising model

Abstract

Experiments over a long range of frequencies reveal that the critical dynamics of random-field Ising models is dominated by activated hopping but the relevant exponent is quite different from the theoretical expectations based on the zero-temperature fixed point. We show that a careful application of dynamic scaling, and zero-temperature fixed point leads to an ever present "correction to scaling,''which causes the measured exponent to differ strongly from the expected value.