Winkler, U. ; Eich, D. ; Chen, Z. H. ; Fink, R. ; Kulkarni, S. K. ; Umbach, E. (1999) Detailed investigation of CdS nanoparticle surfaces by high-resolution photoelectron spectroscopy Chemical Physics Letters, 306 (1-2). pp. 95-102. ISSN 0009-2614
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Official URL: http://linkinghub.elsevier.com/retrieve/pii/S00092...
Related URL: http://dx.doi.org/10.1016/S0009-2614(99)00427-3
Abstract
Direct and detailed information about the surface of differently sized CdS nanoparticles has been obtained from high-resolution X-ray photoelectron spectroscopy using tunable synchrotron radiation. We identify up to four distinct components in the S 2p core level spectra. Two of them are assigned to bulk and surface S-species of the nanoparticles, the latter arising from a surface core level shift due to their S-termination. The remaining S 2p components stem from S-atoms of the stabilizer thiol group bound to Cd and to S-S-bonds formed by thiol groups which are attached to surface S-atoms. In the latter case, the oxidation of the nanoparticle surface is drastically reduced.
Item Type: | Article |
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Source: | Copyright of this article belongs to Elsevier Science. |
ID Code: | 17960 |
Deposited On: | 17 Nov 2010 13:26 |
Last Modified: | 04 Jun 2011 08:51 |
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