Ghosh, K. ; Ramakrishnan, S. ; Grover, A. K. ; Menon, Gautam I. ; Chandra, Girish ; Rao, T. V. Chandrasekhar ; Ravikumar, G. ; Mishra, P. K. ; Sahni C. V., V. C. ; Tomy, C. V. ; Balakrishnan, G. ; Paul, D. Mck. ; Bhattacharya, S. (1996) Reentrant peak effect and melting of a flux line lattice in 2H-NbSe2 Physical Review Letters, 76 (24). pp. 4600-4603. ISSN 0031-9007
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Official URL: http://prl.aps.org/abstract/PRL/v76/i24/p4600_1
Related URL: http://dx.doi.org/10.1103/PhysRevLett.76.4600
Abstract
A reentrant peak effect is observed through low field ac susceptibility measurements on the weakly pinned flux line lattice in single crystals of 2H-Nb Se2. The resulting phase diagram of the peak effect is strikingly similar to the theoretically predicted reentrant phase boundary which separates flux lattice and flux liquid phases. The broadening and ultimate disappearance of the peak effect at very low fields is consistent with the predicted crossover to a disordered glassy state in this field regime.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Physical Society. |
| ID Code: | 14754 |
| Deposited On: | 12 Nov 2010 13:41 |
| Last Modified: | 16 May 2016 23:43 |
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