Dependence of structural, electrical and optical properties of undoped indium oxide films on thickness

Mirzapour, S ; Rozati, S. M. ; Takwale, M. G. ; Marathe, B. R. ; Bhide, V. G. (1992) Dependence of structural, electrical and optical properties of undoped indium oxide films on thickness Materials Research Bulletin, 27 (9). pp. 1133-1138. ISSN 0025-5408

Full text not available from this repository.

Official URL: http://linkinghub.elsevier.com/retrieve/pii/002554...

Related URL: http://dx.doi.org/10.1016/0025-5408(92)90253-V

Abstract

For highly conducting transparent films, thickness is an important parameter. This investigation optimizes the film thickness to obtain high electrical conductivity without appreciably affecting the transparency. Undoped Indium oxide films having different thickness have been deposited on Corning glass (7059) by using the spray pyrolysis technique. Study of the structural, electrical and optical properties of these films reveals that the mobility increases as the film thickness increases till its value is 6500 Å after which the mobility decreases. This behaviour of the mobility is closely related to the crystallinity of the films. A high value of mobility of 53cm2V-1s-1 has been achieved. The variation in the number of charge carriers with thickness is small. At 6500 Å the lowest value of resistivity obtained is 9.3 ×10-4βcm and the visible transmission is 82 %. Another interesting feature of this work is the improvement in both electrical and optical film properties for the thickest film (1.03 μm) when the substrate temperature is increased from 425°C to 475°C .

Item Type:Article
Source:Copyright of this article belongs to Elsevier Science.
Keywords:Indium; Oxides; Superconductors
ID Code:5070
Deposited On:18 Oct 2010 05:16
Last Modified:19 May 2011 05:02

Repository Staff Only: item control page